scan design

(Or "Scan-In, Scan-Out") A electronic circuit

design design technique which aims to increase the

controllability and observability of a digital {logic circuit}

by incorporating special "{scan register}s" into the circuit

so that they form a {scan path}.

Some of the more common types of scan design include the

{multiplexed register} designs and {level-sensitive scan

design} (LSSD) used extensively by {IBM}. {Boundary scan} can

be used alone or in combination with either of the above

techniques.

["Digital Systems Testing and Testable Design" by Abramovici,

Breuer, and Friedman, ISBN 0-7167-8179-4].

["Design of Testable Logic Circuits" by R.G. Bennetts,

(Brunel/Southhampton Universities), ISBN 0-201-14403-4].

(1995-02-23)